Testing and Verification of VLSI Design

The training program for the Faculty, students and research scholars on the "Testing and Verification of VLSI Design" was conducted by Electronics & Communication Engineering Department, Institute of Technology under Center of Continuing Education, Nirma University.

The main objective of the program is to provide basic fundamentals of different testing and verification methods along with their hands on practice and advances. Functional Verification, ATPG, DFT, BIST and memory testing will be discussed in length with their advance approaches.

The training program got very over whelming response and total 65 participants attended the training program including faculty, students and research scholar. The theory and lab sessions were conducted by our internal faculty Dr Usha Mehta and Dr Vaishali Dhare.